Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films

Artikel › Journalartikel › 2019

Zitation

Kodalle, Tim; Greiner, Dieter; Brackmann, Varvara; Prietzel, Karsten; Scheu, Anja; Bertram, Tobias; Reyes-Figueroa, Pablo; Unold, Thomas; Abou-Ras, Daniel; Schlatmann, Rutger; Kaufmann, Christian A.; Hoffmann, Volker: Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films. In: Journal of Analytical Atomic Spectrometry Vol. 34, Issue 6. (2019), S. 1233-1241.

ISSN

0267-9477

Link

https://doi.org/10.1039/C9JA00075E

Zitieren

BibTeX / RIS