Spherical AFM probes for adhesion force measurements on metal single crystals

Sammelbandbeitrag › Aufsatz › 2007

Zitation

Stegemann, Bert; Backhaus, Hendrik; Kloss, Heinz; Santner, Erich: Spherical AFM probes for adhesion force measurements on metal single crystals. In: Modern Research and Educational Topics in Microscopy. Hg. von A. Méndez-Vilas, J. Díaz. 1. Badajoz, Spanien: Formatex 2007 (Microscopy Book Series 1), S. 820-827.

ISBN

978-84-611-9419-3

Link

http://www.formatex.org/microscopy3/pdf/pp820-827.pdf

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