Atomic Force Microscopy for Electrical Characterization of Silicon Quantum Dots for High-Efficiency Solar Cells

Konferenzbeitrag › Konferenzpaper › 2011

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Stegemann, Bert; Lussky, Thomas; Schöpke, Andreas; Čermák, Jan; Rezek, Bohuslav; Kočka, Jan; Schmidt, Manfred: Atomic Force Microscopy for Electrical Characterization of Silicon Quantum Dots for High-Efficiency Solar Cells. In: Proceedings of the 2nd International Workshop on Advanced Atomic Force Microscopy Techniques. Hg. von KIT. Karlsruhe: 2011, S. [1 page].

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