Influence of chemical composition and structure in silicon dielectric materials on passivation of thin crystalline silicon on glass

Artikel › Journalartikel › 2015

Zitation

Calnan, Sonya; Gabriel, Onno; Rothert, Inga; Werth, Matteo; Ring, Sven; Stannowski, Bernd; Schlatmann, Rutger: Influence of chemical composition and structure in silicon dielectric materials on passivation of thin crystalline silicon on glass. In: ACS applied materials & interfaces Volume 7, Issue 34. (2015), S. 9282-19294.

ISSN

1944-8244

Link

http://dx.doi.org/10.1021/acsami.5b05318

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