Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance–voltage measurements

Artikel › Journalartikel › 2016

Zitation

Preissler, Natalie; Töfflinger, Jan Amaru; Shutsko, Ivan; Gabriel, Onno; Calnan, Sonya; Stannowski, Bernd; Rech, Bernd; Schlatmann, Rutger: Interface passivation of liquid-phase crystallized silicon on glass studied with high-frequency capacitance–voltage measurements. In: physica status solidi a Vol. 213, Issue 7. (2016), S. 1697–1704.

ISSN

1862-6319

Link

http://dx.doi.org/10.1002/pssa.201532957

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