Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films

Typ

Beitrag Zeitschrift von Prof. Dr. Rutger Schlatmann

Zitation

Kodalle, Tim; Greiner, Dieter; Brackmann, Varvara; Prietzel, Karsten; Scheu, Anja; Bertram, Tobias; Reyes-Figueroa, Pablo; Unold, Thomas; Abou-Ras, Daniel; Schlatmann, Rutger; Kaufmann, Christian A.; Hoffmann, Volker: Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films. In: Journal of Analytical Atomic Spectrometry, S. 1233-1241, 2019, ISSN 0267-9477

Homepage

https://doi.org/10.1039/C9JA00075E