Si/SiO2 multiple quantum wells for all silicon tandem cells: conductivity and photocurrent measurements

Typ

Beitrag Zeitschrift von Prof. Dr. Bert Stegemann

Zitation

Rölver, Robert; Berghoff, Birger; Bätzner, Derk; Spangenberg, Bernd; Kurz, Heinrich; Schmidt, Manfred; Stegemann, Bert: Si/SiO2 multiple quantum wells for all silicon tandem cells: conductivity and photocurrent measurements. In: Thin Solid Films, S. 6793-6766, Elsevier B.V., 2008, ISSN 0040-6090

Homepage

http://dx.doi.org/10.1016/j.tsf.2007.12.087