Spherical AFM probes for adhesion force measurements on metal single crystals

Typ

Beitrag Sammelwerk von Prof. Dr. Bert Stegemann

Zitation

Stegemann, Bert; Backhaus, Hendrik; Kloss, Heinz; Santner, Erich: Spherical AFM probes for adhesion force measurements on metal single crystals. In: A. Méndez-Vilas, J. Díaz, Modern Research and Educational Topics in Microscopy, S. 820-827, Formatex, Badajoz, Spanien, 2007, ISBN 978-84-611-9419-3

Homepage

http://www.formatex.org/microscopy3/pdf/pp820-827.pdf