IPA-free texturization of n-type Si wafers: Correlation of optical, electronic and morphological surface properties

Typ

Beitrag Zeitschrift von Prof. Dr. Bert Stegemann

Zitation

Kegel, Jan ; Angermann, Heike ; Stürzebecher, Uta ; Stegemann, Bert: IPA-free texturization of n-type Si wafers: Correlation of optical, electronic and morphological surface properties. In: Energy Procedia, S. 833-842, 2013, ISSN 1876-6102

Homepage

http://dx.doi.org/10.1016/j.egypro.2013.07.353