Advanced Process Monitoring and OEE Metrics: Leveraging AASs for Efficiency
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› 2025
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Konferenzbeitrag Full Paper
Zielstorff, Aaron; Schöttke, Dirk; Büttner, Fiona Helena; Kämpfe, Thomas; Schäfer, Stephan: Advanced Process Monitoring and OEE Metrics: Leveraging AASs for Efficiency. In: IEEE - Innovative Intelligent Industrial Production and Logistics. Hg. von Michele Dassisti, Kurosh Madani, Hervé Panetto. Porto: Springer International 2025, S. 1-17.