Quantifying Burstiness in Stochastic Bit Sequences
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› 2026
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Krishnakumar, Yadu Krishnan; Ahrens, Andreas; Lange, Christoph; Zaščerinska, Jelena; Grote, Olaf: Quantifying Burstiness in Stochastic Bit Sequences. In: 26th International Microwave and Radar Conference (MIKON 2026). Kraków (Polen), 18.–21. Mai 2026. Hg. von Institute of Electrical and Electronics Engineers (IEEE). Piscataway, NJ (USA): 2026, S. 222-226.