Atomic Force Microscopy for Electrical Characterization of Silicon Quantum Dots for High-Efficiency Solar Cells

Typ

Beitrag Konferenzband von Prof. Dr. Bert Stegemann

Zitation

Stegemann, Bert ; Lussky, Thomas ; Schöpke, Andreas ; Čermák, Jan ; Rezek, Bohuslav ; Kočka, Jan ; Schmidt, Manfred : Atomic Force Microscopy for Electrical Characterization of Silicon Quantum Dots for High-Efficiency Solar Cells. In: Proceedings of the 2nd International Workshop on Advanced Atomic Force Microscopy Techniques, S. [1 page], Karlsruhe, 2011